- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/2208 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement all measurements being of secondary emission, e.g. combination of SE measurement and characteristic X-ray measurement
Patent holdings for IPC class G01N 23/2208
Total number of patents in this class: 27
10-year publication summary
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1
|
0
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0
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2
|
2
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5
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4
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5
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7
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0
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| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Nova Measuring Instruments Inc. | 59 |
3 |
| Commonwealth Scientific and Industrial Research Organisation | 1652 |
2 |
| Enersoft Inc. | 28 |
2 |
| JEOL Ltd. | 556 |
2 |
| Oxford Instruments NanoTechnology Tools Limited | 145 |
2 |
| Chrysos Corporation Limited | 15 |
2 |
| Samsung Electronics Co., Ltd. | 131630 |
1 |
| Howmedica Osteonics Corp. | 1377 |
1 |
| Aramco Services Company | 3504 |
1 |
| GLOBALFOUNDRIES U.S. Inc. | 6459 |
1 |
| Korea Atomic Energy Research Institute | 418 |
1 |
| Lkr Leichtmetallkompetenzzentrum Ranshofen GmbH | 16 |
1 |
| National Institute for Materials Science | 1108 |
1 |
| Rigaku Corporation | 379 |
1 |
| Saudi Arabian Oil Company | 11322 |
1 |
| SciAps, Inc. | 36 |
1 |
| University of Massachusetts | 2130 |
1 |
| Institute of Animal Science and Veterinary Medicine,shandong Academy of Agricultural Sciences | 8 |
1 |
| Hitachi High-Tech Corporation | 4424 |
1 |
| Nova Ltd. | 145 |
1 |
| Other owners | 0 |